The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to the budget-conscious lab. This high resolution SEM is ideal for both imaging and analysis of nanostructures, and determining chemical composition of the sample through X-ray spectroscopy.
JSM-7900F Field Emission SEM
The JSM-7900F Field Emission SEM is a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled…
JSM-IT500HR InTouchScope
High resolution SEM with high brightness, long life emitter (1.5nm at 30kV, 4nm at 1kV) Magnification up to 600,000X (print),…
Optical microscopy
For over 170 years, KERN & SOHN has been synonymous with high precision weighing and measuring technology. This claim is…
