The JSM-7600F offers true 1,000,000X magnification with 1nm resolution and unmatched stability, making it possible to observe the fine surface morphology of nanostructures.
Transmission Electron Microscopes
JEOL is a world leader in the development and manufacture of high performance, high stability Transmission Electron Microscopes (TEM). We…
JSM-7200F/LV All-in-One FE-SEM
The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to…
JSM-IT500HR InTouchScope
High resolution SEM with high brightness, long life emitter (1.5nm at 30kV, 4nm at 1kV) Magnification up to 600,000X (print),…
