The JSM-7600F offers true 1,000,000X magnification with 1nm resolution and unmatched stability, making it possible to observe the fine surface morphology of nanostructures.
Optical microscopy
For over 170 years, KERN & SOHN has been synonymous with high precision weighing and measuring technology. This claim is…
JSM-IT500HR InTouchScope
High resolution SEM with high brightness, long life emitter (1.5nm at 30kV, 4nm at 1kV) Magnification up to 600,000X (print),…
JSM-7200F/LV All-in-One FE-SEM
The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to…
