High resolution SEM with high brightness, long life emitter (1.5nm at 30kV, 4nm at 1kV)
Magnification up to 600,000X (print), >1,670,000X (display)
Fully integrated and automated low vacuum system
Large analytical chamber and stage can cover samples 178mm (d) x 80mm (h)
Navigation is easy with embedded color camera
Small foot print and easy maintenance (no cooling water or compressed gas required)
The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to…
JEOL is a world leader in the development and manufacture of high performance, high stability Transmission Electron Microscopes (TEM). We…
The JSM-7600F offers true 1,000,000X magnification with 1nm resolution and unmatched stability, making it possible to observe the fine surface…
