The JSM-7900F Field Emission SEM is a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis. This tool excels in lightning fast data acquisition through simple and automated operation.
Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens.
The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to…
JEOL is a world leader in the development and manufacture of high performance, high stability Transmission Electron Microscopes (TEM). We…
The JSM-7600F offers true 1,000,000X magnification with 1nm resolution and unmatched stability, making it possible to observe the fine surface…
