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JSM-7200F/LV All-in-One FE-SEM

The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new…

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JSM-7610F Scanning Electron Microscope

The JSM-7600F offers true 1,000,000X magnification with 1nm resolution and unmatched stability, making it possible…

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JSM-7900F Field Emission SEM

The JSM-7900F Field Emission SEM is a uniquely flexible platform that combines the ultimate in…

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JSM-IT100 InTouchScope™

High resolution imaging in HV/LV/SE/BSE Chemical analysis with integrated EDS Multi-touch screen control and wireless…

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IT500 InTouchScope SEM Series

Zeromag – Simplifies Navigation and enhances throughput. Providing a seamless transition from an optical to…

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JSM-IT500HR InTouchScope

High resolution SEM with high brightness, long life emitter (1.5nm at 30kV, 4nm at 1kV)…

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JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.

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